IEC 60410 Ed. 1.0 b:1973

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Sampling plans and procedures for inspection by attributes

Establishes sampling plans and procedures for inspection by attributes. These sampling plans are applicable, but not limited, to inspection of end items, components and raw materials, operations, materials in process, supplies in storage, maintenance operations, data or records and administrative procedures.

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International Electrotechnical Commission [iec]

Historical

Sampling plans and procedures for inspection by attributes

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Historical

IEC 60410 Ed. 1.0 b:1973

Sampling plans and procedures for inspection by attributes

Are the documents at the ANSI Webstore in electronic Adobe Acrobat PDF format only?

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