IEC 61164 Ed. 2.0 en:2004

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Reliability growth - Statistical test and estimation methods

Gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.

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International Electrotechnical Commission [iec]

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Reliability growth - Statistical test and estimation methods

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IEC 61164 Ed. 2.0 en:2004

Reliability growth - Statistical test and estimation methods

Are the documents at the ANSI Webstore in electronic Adobe Acrobat PDF format only?

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