Most recent

ISO 24173:2024

Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction


This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.


CONTENT PROVIDER
International Organization for Standardization [iso]

Document History
Revises:
Included in Packages
This standard is not included in any packages.
Amendments & Corrections
We have no amendments or corrections for this standard.